International Journal of Innovative Research in Computer and Communication Engineering
ISSN Approved Journal | Impact factor: 8.771 | ESTD: 2013 | Follows UGC CARE Journal Norms and Guidelines
| Monthly, Peer-Reviewed, Refereed, Scholarly, Multidisciplinary and Open Access Journal | High Impact Factor 8.771 (Calculated by Google Scholar and Semantic Scholar | AI-Powered Research Tool | Indexing in all Major Database & Metadata, Citation Generator | Digital Object Identifier (DOI) |
| papers | A Concurrent BIST Architecture for Testing Integrated Circuits with Modified SRAM CellsC.CATHERINE RENI, C.NAVEEN AROCKIA RAJ, M.SIVAKUMARP.G. Student, Department of ECE, Adhiyamaan College of Engineering, M.G.R Nagar, Hosur, India U.G. Student, Department of ECE, Adhiyamaan College of Engineering, M.G.R Nagar, Hosur, India Associate Professor, Department of ECE, Adhiyamaan College of Engineering, M.G.R Nagar, Hosur, India |
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| pdf/GEYXVHZ2Bg36kuSBWZhuUfOWE90zx2N5nnLqJTdY.pdf |
